Abstract
An experiment to find out the removal mechanism of PEG(polyethyleneglycol) by using UV-enhanced GPC (gas phase cleaning) at low substrate temperature below was executed under various process conditions, such as substrate temperature, UV exposure, and gas. The possibility of using GPC as a low-temperature in-situ cleaning tool for organic removal was confirmed by the removal of a PEG film with a thickness of about 200 nm within 150 sec at a substrate temperature of . Synergistic effects by combining photo-dissociation and photo oxidation can only remove the entire PEG film without residues within experimental splits. In GPC with substrate temperatures higher than the glass transition temperature, the substantial increase in the PEG removal rate can be explained by surface-wave formation. The photo-dissociation of PEG film by UV exposure results in the formation of end aldehyde by dissociation of back-bone chain and direct decomposition of light molecules. The role of oxygen is forming peroxide radicals and/or terminating the dis-proportionation reaction by forming peroxide.
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More From: Journal of the Korean Institute of Electrical and Electronic Material Engineers
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