Abstract

UV spectra of samples prepared by vacuum deposition of Sm and Yb thin films on 100–200-nm thick films of the RbAg4I5 solid electrolyte (SE) at 300–350 K contain strong absorption bands peaking at about 4.3 and 5.0 eV. After deposition of ∼5 nm of Sm, the ionic conductivity σ of the samples decreases from σ0 to ≈0.9 σ0, and the SE lattice parameter, from 11.24 to ≈11.15 A, with the x-ray reflection halfwidth increasing from 0.5 to 0.8°. Further growth of Sm concentration in the samples changes the x-ray diffraction pattern, the absorption at 4.3 and 5.0 eV increases, a new absorption edge forms at 3.8 eV, and σ decreases down to ∼10−2σ0. It is conjectured that the strong UV absorption bands in heavily defected silver halides of the RbAg4I5-Sm(Yb) system is genetically related to the 4d10→4d95s electronic transitions in free Ag+ ions.

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