Abstract
In this paper, the influence of solvents and reinforcement processing methods on the mechanical properties of nanocomposite poly-(methyl methacrylate) PMMA-Ti3C2Tx MXene was investigated. A weight fraction of reinforcement was 1% and two types of solvents were used for sample preparation: dimethylformamide (DMF) and acetone (Ac). Deionized water and DMF were used to delaminate the MXene. An additional peak at 1675 cm-1 was observed on the FTIR spectra of the obtained samples, which indicates that some amount of DMF remained in the material after drying. The results of microindentation show that samples where MXene was delaminated in deionized water and PMMA dissolved in acetone had a 74.46% higher reduced modulus of elasticity, which is supported by SEM images where better dispersion of MXenes is observed.
Highlights
MATERIJALI I METODEKao ojačanje u nanokompozitima korišćeni su makseni dobijeni MILD (minimaly intensive layer delamination) metodom
two types of solvents were used for sample preparation
An additional peak at 1675 cm-1 was observed on the FTIR spectra of the obtained samples
Summary
Kao ojačanje u nanokompozitima korišćeni su makseni dobijeni MILD (minimaly intensive layer delamination) metodom. Sintetisane su 2 serije uzoraka: Serija A – talog je ponovo dispergovan u dejonizovanoj vodi i tretiran 1 h u ultrazvučnom kupatilu uz produvavanje argonom. Serija B – talog je ponovo dispergovan u DMF-u i tretiran h u ultrazvučnom kupatilu uz produvavanje argonom. Disperzija je nakon tretmana u ultrazvučnom kupatilu centrifugirana 30 min na 3000 o/min i prikupljen je supernatant. Nakon 24 h rastvaranja na magnetnoj mešalici, rastvor je izliven u petri šolju i sušen 24 h na 70oC. Tvrdoća i redukovani modul su za svaki uzorak izračunati pomoću metode koju su opisali Oliver i Pharr [17]. Gde F predstavlja opterećenje, x dubinu indentacije, a P, x_0 i m parametre modela koji se određuju metodom najmanjih kvadrata. Krutost K = dF/dx izračunata je pri maksimalnoj dubini indentacije i maksimalnom opterećenju (x_max,F. max). SEM snimci su dobijeni na elektronskom mikroskopu FESEM Tescan MIRA 3 XMU
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