Abstract
A multi-valued algebraic system by using the notion of M-algebra is introduced. The system, called D-algebra, is represented as an isomorphic image of the direct product of two M-algebras. Next this D-algebra is used to generate tests for m-logic combinational circuits (i.e. circuits which realize m-valued logic functions, m ≥ 2). The test generation is a fault oriented process (tests are derived for specific faults). This process is illustrated by means of an informal modification of the classical Roth D-algorithm (a more formal treatment is omitted). For simplicity, only the s-a-fault model is considered and several examples are given.
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