Abstract
Because of high development costs of IC (Integrated Circuit) test programs, recycling existing test programs from one kind of ATE (Automatic Test Equipment) to another or generating directly from CAD simulation modules to ATE is more and more valuable. In this paper, a new approach to migrating test programs is presented. A virtual ATE model based on object-oriented paradigm is developed; it runs Test C++ (an intermediate test control language) programs and TeIF (Test Intermediate Format—an intermediate pattern), migrates test programs among three kinds of ATE (Ando DIC8032, Schlumberger S15 and GenRad 1732) and generates test patterns from two kinds of CAD (Daisy and Panda) automatically.
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