Using variable clocking to reduce leakage in synchronous circuits

Abstract

There is a growing demand for high-performance, low-power systems, particularly in portable devices. New approaches to design are needed in technologies with feature sizes of 90 nm and below to reduce leakage power and to deal with process variations, which force designers to use increasingly conservative delay estimations. This paper presents a variable clock generator for a conventionally-designed synchronous circuit core. The clock frequency adjusts automatically to inter-and intra-chip process, voltage and temperature variations, making it possible to design the circuit assuming typical rather than worst-case conditions. The resulting circuit uses much fewer high-speed, low-voltage-threshold cells, and consequently has significantly reduced leakage power. Post-layout test results on a 32-bit microprocessor implemented in 90-nm technology showed 10X less leakage and 19% less dynamic power when operating under typical conditions, compared to a conventional, fixed-frequency implementation. The system is functional under all PVT corners.