Abstract
This study emerged as a result of the inability of Basic Six (6) at Zogbeli Primary School pupils in Tamale, Northern Region Ghana to understand the concept of multiplying multi-digit multiplicands. To address this problem, the action research methodology was used to provide an immediate solution. A simple random sample of 45 pupils from a total of 90 pupils of a mixed class of P.6A and P.6B was chosen to participate in the study. A Pre-test consisting of 10 test items was administered to assess the pupils’ initial understanding of the concept. The results showed that the majority of the pupils scored poorly, with a mean score of 1.51 and a standard deviation of 0.91. An intervention using the lattice method for five days was then implemented. The lattice method is a hands-on learning method that involves both physical movement and mental engagement. It was hypothesized that this method would help the pupils to develop a deeper understanding of the concept of multiplying multi-digit multiplicands. After the three-day intervention, a Post-test was administered to assess the pupils’ understanding of the concept of multiplying multi-digit multiplicands and also to assess how effective the intervention was in the study. The results showed a significant improvement, with a mean score of 8.11 and a standard deviation of 2.54. Additionally, 93.4% of the pupils scored above the average mark of 5. The findings of this study suggest that lattice technology is an effective method for teaching the concept of multiplying multi-digit multiplicands. This method is engaging and easy to understand, and it can help pupils develop a deeper understanding of the mathematical concepts involved. In conclusion, the use of lattice technology has improved the learning experiences of Basic Six pupils at Zogbeli Primary School. Pupils now have a practical method for solving multi-digit multiplication problems, and they have a better understanding of the mathematical concepts involved. Keywords: Action Research, Pre-test, Post-test, Paired Sample t-test, Lattice technology
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