Using six-port reflectometer measurement of complex dielectric constant

Abstract

This paper presented the measuring principle of complex dielectric constant using six-port reflectometer and the mathematical model of computer software to perform this measurement. The experiment results of measuring Teflon material using six-port reflectometer at X-band are given. The complex dielectric constant of the same material is measured using the resonant cavity technique. The agreement of two results provides evidence of the validity of this theory.