Abstract
Materials displaying colossal magnetoresistance (CMR) are candidates for important applications such as high density data storage. When the CMR material is in the form of a thin film on a substrate, the strain which results from lattice mismatch with the substrate alters the behavior of the material. As for CMR materials in bulk form, there should be a correlation between the CMR behavior and the structural and elastic properties of the strained thin films. Measurements of the elastic properties of thin films are obtained using a novel small sample resonant ultrasound spectroscopy (RUS) technique. Thin films of the magnetic material are deposited on a substrate and the difference in natural frequencies are then used to obtain the elastic constants of the film. The dominant CMR materials are perovskite manganites, a transition metal oxide. They exhibit a variety of exotic structural, magnetic and electrical behaviors, which is yet to be understood. In this paper measurements of the electrical resistance and elastic constants of 200 and 400 nm thin films, as well as unstrained samples, of the CMR material La(0.7)Ca(0.3)MnO3 are presented. [Work supported by ONR.]
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