Using reflection resonances to improve depth of field for imaging at ultra-high numerical apertures

P Mehrotra,R J Blaikie

doi:10.1109/iqec-cleo.2011.6193704

Using reflection resonances to improve depth of field for imaging at ultra-high numerical apertures

P Mehrotra, R J Blaikie

https://doi.org/10.1109/iqec-cleo.2011.6193704

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Publication Date: Aug 1, 2011

Affiliation: MacDiarmid Institute for Advanced Materials and Nanotechnology, University of Canterbury

#Depth Of Field For Imaging #Depth Of Field + Show 7 more

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Abstract

Imaging at ultra-high numerical apertures imposes severe constraints on the depth of field (DOF). We show how reflection resonances from underlayers can be used to enhance DOF in this regime and present an Equivalent Reflectance Approach (ERA) as a versatile design tool.

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