Abstract
Abstract. The Russian wheat aphid, Diuraphis noxia (Kurdjumov), and greenbug, Schizaphis graminum (Rondani) (Hemiptera: Aphididae), are important insect pests of wheat, Triticum aestivum L. Outbreaks of both pests in commercial wheat fields occur almost every year in the Great Plains of the United States. Infestations of both pests in wheat fields are clumped in distribution, and as a result so is the injury to plants in the field. The spatial pattern of patches of plants injured by the two aphid pests can be detected using airborne multispectral imaging. This study used multispectral imagery of wheat fields infested by the two species of aphids analyzed using spatial-pattern metrics with the purpose of determining differences between species in the spatial pattern of injury to wheat plants in fields. Analyses using Students t-tests revealed patches of wheat within fields injured by Russian wheat aphid were larger, more complex in shape, and more isolated than patches of wheat injured by greenbug. Our fin...
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
