Abstract
Abstract Controlling the self-assembly of carbon nanotube (CNT) forests is important for tailoring their ensemble properties for specific applications. In this study, real-time electrical resistance measurements of in-situ CNT forest syntheses was established as a method to interrogate the evolution of CNT forest morphology. The method employs in-situ scanning electron microscopy (SEM) synthesis techniques to correlate observed morphological changes to electrical resistance. A finite-element simulation was used to simulate CNT forest synthesis and the evolution of electrical resistance in a configuration like that used experimentally. The simulation considers the contribution of CNT electrical resistance, CNT-CNT junction resistance, and CNT-electrode contact resistance. Simulation results indicate that an increased number of CNT-CNT junctions with time have a diminishing effect on increasing electrical conductance. Experimentally observed increases in electrical resistance are attributed to increasing CNT delamination from the electrical contacts.
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