Abstract
We have demonstrated the ability of the quartz crystal microbalance to successfully measure the formation and dissociation of thin films of Xe hydrate formed from ice films in the presence of Xe gas or from a cooled mixture of water vapor and Xe gas. By monitoring the uptake of mass, we have measured the formation of Xe hydrates on ice films in the temperature range 180<T<251K. Analysis of the mass uptake reveals a final sample that has 60% by weight of Xe, in good agreement with a fully hydrated sample. The formation and dissociation conditions suggest that there is a critical temperature T0∼255K beyond which thin films of Xe hydrate are not stable.
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