Abstract
Electron microscopy is the most effective technique to obtain directly and dynamically topographic information in the atomic scale, and results in the sensation of both “seeing is believing” and “the materials are living”. In the present paper, usefulness and applications of electron microscopy to materials science are discussed from the following two viewpoints, i.e., high-resolution electron microscopy and high-voltage electron microscopy.KeywordsStack Fault EnergyElectron IrradiationDiffract BeamPhase Contrast ImagingTransmitted BeamThese keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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