Abstract
AbstractA study has been conducted with gibbsite specimens, on the use of Rietveld X-ray powder diffraction (XRPD) pattern fitting for quantitating preferred orientation in powders. This study has shown that an earlier formula gives results which correlate closely with an empirical measure of morphology proposed recently for gibbsite powders, viz., the ratio of the XRPD intensities for the (002) line and the (110, 200) doublet lines. A method is proposed on the basis of this correlation for the correction for preferred orientation of line intensities in gibbsite powder patterns. The correction method appears to have excellent potential for XRPD quantification of gibbsite levels in mixtures, and could have general application for coping with preferred orientation effects in the quantitation of other phases.
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