Abstract
Thin films are used to investigate the transformation by heat treatment of a disordered phase into an ordered phase in two different cases: compositional disorder in the case of metallic (Au-Cu) alloys, and positional disorder in the case of an amorphous semiconductor (Ge). The transformation is followed by simultaneous resistance measurements and controlled by electron diffraction and electron microscopy; its effects on the optical properties are measured. The use of thin films allows one to characterize accurately the phases before and after the transformation, and to check that the transformation has been completed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callSimilar Papers
More From: Thin Solid Films
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
