Use of thin collodion films to prevent recoil-ion contamination of alpha-spectrometry detectors

Abstract

Recoil ions from alpha-particle emission can contaminate surface-barrier detection systems. This contamination results in increased measurement uncertainty, and may require the replacement of expensive detectors. Disposable thin Collodion films are easily prepared and effectively retard the recoil ions when either directly applied to the surface of alpha-sources or as catcher foils between the source and the detector. The thin films are particularly effective for relatively low-level sources, but can sustain structural damage when exposed to high levels of recoil ions (tens of thousands per second) over extended periods of time.