Abstract
The application of a time-of-flight neutron diffractometer for crystallographic investigations, designed on the basis of a pulsed neutron source, is discussed. The procedure for obtaining integrated intensities and introducing corrections is described. The results of a test experiment with perdeuteronaphthalene are given. The deuterium atom positions in the structure of La2Mg3(NO3)12.24D2O are also refined and compared with those obtained using X-ray diffraction techniques. The observed systematic differences in bond lengths and valence angles are explained by the differences between the 'X-ray' and 'neutron' coordinates of the light atoms.
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