Abstract
The CEARXRF GUI‐Based Monte Carlo–Library Least‐Squares (MCLLS) Code is demonstrated with results from a micro‐focused EDXRF analyzer, which can be used to calculate elemental weight fractions in metal alloys or rock samples accurately by library least‐squares regression of the measured X‐ray spectrum with computer‐generated elemental library spectra. An elemental stratified sampling variance reduction technique has been implemented in the CEARXRF5 code, which equalizes the statistical precision of the elemental libraries within the measured sample independent of the relative elemental amounts that are present. Also, an improved Si(Li) detector response function (DRF) has been obtained for micro‐focused X‐ray fluorescence (XRF) analyzers, and the DRF parameters are obtained based on regression from pure elemental experimental spectra. It is demonstrated that the resulting MCLLS approach can greatly improve the accuracy of elemental XRF analysis results. Copyright © 2011 John Wiley & Sons, Ltd.
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