Abstract
The new 4x4 matrix method described by Lin-Chung and Teitler [P. J. Lin-Chung and S. Teitler, J. Opt. Soc. Am. A 1, 703 (1984)] is used to study the optics of multilayer magnetooptic recording media. It is demonstrated that the method is capable of handling very complicated optical multilayer structures. For a quodrilayer magnetooptic recording system consisting of an overcoat layer, a magnetic layer, an intermediate dielectric layer, and a reflector, the readout of the system is optimized against the thickness of the overcoat and intermediate layers. As well, cases of oblique angle of incidence, anisotropy in the nonmagnetic part of the dielectric constants, and misalignment of the magnetization are treated.
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