Abstract
An optical cavity is defined here as a thin dielectric film of relatively high refractive index, surrounded by vacuum or by dielectrics with lower refractive index, so that the reflection coefficients on both boundaries of the cavity are almost unity. The use of such cavities for the detection and investigation of thin surface films is briefly discussed. The advantages of using ellipsometric rather than photometric measurements are indicated. A nonabsorbing surface film can be investigated by the former technique only. A discussion of the influence of a slight absorption in the films constituent of the cavity is also given.
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