Abstract
The principles of construction and the components of a model of X-ray fluorescence signal generation are considered in this paper. It is shown that the developed model describes the X-ray spectra of various materials rather well. Issues with choosing the optimal parameters of measurements in the quantitative X-ray fluorescence analysis of individual samples using the constructed models are discussed.
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More From: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
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