Abstract
It is experimentally shown that the edge effect and corresponding X-ray diffraction focusing can be observed simultaneously using a system with two thin blocks (μt < 1) and a narrow air gap (nondiffraction zone). A condition for achieving high-resolution Moire patterns in two-block systems is found. The correlation between the edge effect and focusing in two-block systems is revealed.
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Schedule a callMore From: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
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