Use of a charge coupled device-camera system for optical diagnostics of intense ion beams

Abstract

Among the various possibilities for investigating the properties of ion beams, two of the most important principles for determining the beam quality are profile measurements using wires or slit apertures, and different kinds of emittance measurement devices. However, most of the commonly used systems have the disadvantage of being either destructive to the beam, or at least to have a considerable influence on the further beam propagation downstream of the point of measurement. Also, for the investigation of intense ion beams, thermal problems on the scanners themselves might arise. Observation of particles emitted from the ion beam in radial direction allow an indirect but nondestructive observation of the beam. Of the different optical methods that exist to accomplish this, we recently conducted an investigation on the possibilities to employ a charge coupled device-camera system for such nondestructive beam diagnostics in our space-charge compensation test stand. First, experimental results on optical profile measurements are presented and compared to results obtained by a slit scanner and a wire scanner. Additionally, to gain a better understanding of the measured data, optically obtained sectional profiles behind a slit and a circular aperture were analyzed. Possibilities for gaining information on the two-dimensional beam profile and the beam emittance are explored.