Upsampling speckle patterns for coherent X-ray diffraction imaging

Abstract

Coherent X-ray diffraction imaging is a lensless imaging technique where an iterative phase-retrieval algorithm is applied to the speckle pattern, the far-field diffraction pattern produced by an isolated object. To ensure convergence to a unique solution, the diffraction pattern must be oversampled by a factor of two or more. Since the resolution in real space depends on the maximum wave vector where the intensity is detected,i.e.on the detector field of view, there is a practical limitation on oversampling in reciprocal space and resolution in real space that is ultimately determined by the number of pixels. This work shows that it is possible to reduce the effective pixel size and maintain the detector field of view by applying a linear combination method to shifted diffraction patterns. The feasibility of the method is demonstrated by reconstructing the images of test objects from diffraction patterns oversampled in each dimension by factors of 1.3 and 1.8 only. The described approach can be applied to any diffraction or imaging technique where the resolution is compromised by a large pixel size.