Abstract
Electron yield was measured from patterned carbon nanotube forests for a wide range of primary beam energies (400-20,000 eV). It was observed that secondary and backscattered electron emission behaviors in these forests are quite different than in bulk materials. This seems to be primarily because of the increased range of electrons due to the porous nature of the forests and dependent on their structural parameters, namely nanotube length, diameter and inter-nanotube spacing. In addition to providing insight into the electron microscopy of nanotubes, these results have interesting implications on designing novel secondary electron emitters based on the structural degrees of freedom of nanomaterials.
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