Abstract
Local electric-field around multitype pores (dielectric pore, interface pore, electrode pore) in multilayer ceramic capacitors (MLCCs) was investigated using Kelvin probe force microscopy combined with the finite element simulation to understand the effect of pores on the electric reliability of MLCCs. Electric-field is found to be concentrated significantly in the vicinity of these pores and the strength of the local electric-field is 1.5–5.0 times of the nominal strength. Unexpectedly, the concentration degree of the pores in the inner electrode is much higher than that in the dielectrics and dielectric-electrode interfaces. Meanwhile, geometry orientations are found to have a remarkable influence on the local electric field strength. The pores act as an insulation degradation precursor via local electric, thermal center, and oxygen vacancies accumulation center. Such unusual local electric field concentration of multitype pores can provide new insights into the understanding of insulation degradation evolution, processing tailoring and design optimization for MLCCs.
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