Abstract

The weak bias field applied on perpendicular direction of the external field provides an excellent opportunity to investigate the in-plane magnetization reversal process of Fe/Si(001) film. In this work, we present the magneto-optical Kerr effect test of Fe single crystal film grown on Si(001) substrate with ultrathin p(2 × 2) iron silicide as buffer layer. Owing to the weak bias field, both 180° and 90° domain wall displacements were observed in one hysteresis loop between the easy axis and hard axis of iron film. Furthermore, both the 180° and 90° domain wall pinning energies can be derived from one hysteresis loop with weak bias field.

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