Abstract

Electroencephalography (EEG) is used in the diagnosis, monitoring, and prognostication of many neurological ailments including seizure, coma, sleep disorders, brain injury, and behavioral abnormalities. One of the primary challenges of EEG data is its sensitivity to a breadth of non-stationary noises caused by physiological-, movement-, and equipment-related artifacts. Existing solutions to artifact detection are deficient because they require experts to manually explore and annotate data for artifact segments. Existing solutions to artifact correction or removal are deficient because they assume that the incidence and specific characteristics of artifacts are similar across both subjects and tasks (i.e., “one-size-fits-all”). In this paper, we describe a novel EEG noise-reduction method that uses representation learning to perform patient- and task-specific artifact detection and correction. More specifically, our method extracts 58 clinically relevant features and applies an ensemble of unsupervised outlier detection algorithms to identify EEG artifacts that are unique to a given task and subject. The artifact segments are then passed to a deep encoder-decoder network for unsupervised artifact correction. We compared the performance of classification models trained with and without our method and observed a 10% relative improvement in performance when using our approach. Our method provides a flexible end-to-end unsupervised framework that can be applied to novel EEG data without the need for expert supervision and can be used for a variety of clinical decision tasks, including coma prognostication and degenerative illness detection. By making our method, code, and data publicly available, our work provides a tool that is of both immediate practical utility and may also serve as an important foundation for future efforts in this domain.

Highlights

  • Electroencephalography (EEG) devices are pervasive tools used for clinical research, education, entertainment, and a variety of other domains [1]

  • We propose an end-to-end pre-processing pipeline for the automated identification, rejection, and removal/correction of EEG artifacts using a combination of feature-based and deep-learning models which is intended for use as a general-purpose EEG pre-processing tool

  • The best outlier detector was an Locally Selective Combination in Parallel (LSCP) ensemble classifier that performed 16.86x better than the baseline method, and 1.03x better than the best approach; the best performing configuration of the classifier consisted of two HBOS classifiers and one One Class SVM Detector (OCSVM)

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Summary

Introduction

Electroencephalography (EEG) devices are pervasive tools used for clinical research, education, entertainment, and a variety of other domains [1]. Manual annotation of artifacts in EEG data is problematic because it is time-consuming and may even be untenable if the specific profiles of artifacts in the EEG data vary as a function of the task, the subject, or the experimental trial within a given task for a given subject, as they so often do. These realities quickly scale the complexity of the artifact annotation problem and make the use of a one-size-fits-all artifact detection method infeasible for many practical use cases

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