Abstract
Magnetic Force Microscopy (MFM) is the principal characterization technique for the study of low-dimensional magnetic materials. Nonetheless, during years, the samples under study was limited to samples in the field of data storage, such as longitudinal hard disk, thin films, or patterned nanostructures. Nowadays, thanks to the advances and developments in the MFM modes and instrumentation, other fields are emerging like skyrmionic structures, 2D materials or biological samples. However, in these experiments artifacts in the magnetic images can have strong impact and need to be carefully verified for a correct interpretation of the results. For that reason, in this paper we will explore new ideas combining the multifrequency modes with the information obtained from the experimental dissipation of energy associated to tip-sample interactions.
Highlights
In a previous work [27], we demonstrated that the Magnetic Dissipation Force Microscopy (MDFM) can be used to detect the magnetization switching of a relatively small number of spins
Samples: The results shown in the manuscript correspond to two reference samples: FePd thin film growth by Molecular Beam Epitaxy (MBE) with strong perpendicular anisotropy and CoCr thin films prepared by sputtering with lower anisotropy
The bimodal Magnetic Force Microscopy (MFM) configuration is characterized by a single amplitude modulation feedback loop acting on the 1st mode
Summary
In 1981, 40 years ago, science began a new revolution with the development of the Scanning Tunneling Microscope [1]. This is the starting point of the family of Scanning. Force Microscopy (SFM) [2] has become a very powerful tool for nanomaterials characterization such as nanoparticles, nanowires and nanostructures or low dimensional systems. These techniques can be used to characterize the topography and to detect a variety of interactions such as magnetic, chemical, mechanical, electrical properties, surface potential or even thermal gradients with extraordinary sensitivity and resolution.
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