Abstract
A new geometry for electron-phonon scattering spectroscopy (EPSS) is proposed and applied to study the unoccupied density of states in solid Xe. It makes use of a substrate with a wavelike surface topology to support thick films of the material under study. In this way, EPSS can be applied to the study of wide-gap materials, without the previous limitation concerning the magnitude of the band gap. Experimental results obtained with this method are presented for a thick film of solid Xe and compared with other experimental and theoretical results from the literature.
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