Abstract
This paper demonstrates how Signal Subspace Sampling (SSS) is an effective pre-processing step for Non-negative Matrix Factorization (NMF) or Vertex Component Analysis (VCA). The approach allows to uniquely extract non-negative source signals which are orthogonal in at least one observation channel, respectively. It is thus well suited for processing hyperspectral images from X-ray microscopy, or other emission spectroscopies, into its non-negative source components. The key idea is to resample the given data so as to satisfy better the necessity and sufficiency conditions for the subsequent NMF or VCA. Results obtained both on an artificial simulation study as well as based on experimental data from electron-microscopy are reported.
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