Abstract
Amorphous Ge2Sb2Te5 thin films doped with ZnO were prepared and their crystallization behaviors were investigated. Our results showed that thermal annealing of amorphous ZnO-Ge2Sb2Te5 nanocomposites produced face centered-cubic Ge2Sb2Te5-nanocrystals embedded between interfaces. An increase in crystallization temperature and electrical resistance ratio were attributed to the increase of specific interfacial energies and inhomogeneous strain at the oxide/Ge2Sb2Te5 interfaces. The formation of the interfaces not only accelerated crystallization, but also limited the grain growth due to the one-dimensional growth mode. We proposed a crystallization model to elucidate the derived kinetic mechanism of the nanocrystal growth in the Ge2Sb2Te5 matrix. These experimental observations suggest that ZnO-Ge2Sb2Te5 nanocomposites are a good candidate for the applications in phase change memory.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
