Abstract
The origin of so-called "subatomic" resolution in dynamic force microscopy has remained controversial since its first observation in 2000. A number of detailed experimental and theoretical studies have identified different possible physicochemical mechanisms potentially giving rise to subatomic contrast. In this study, for the first time we are able to assign the origin of a specific instance of subatomic contrast as being due to the back bonding of a surface atom in the tip-sample junction.
Highlights
Since atomic resolution was first obtained by scanning probe microscopy (SPM),[1] scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) have become invaluable tools for both surface science and nanoscience
A parallel stream of work, pioneered by the group at IBM Zurich, involves the functionalisation of a metal tip with a known molecule or atom in order to provide a well defined termination. This has been key to both obtaining, and interpreting, striking sub-molecular resolution on planar organic molecules in dynamic force microscopy (DFM) - known as non-contact atomic force microscopy (NC-AFM).[8]
All experiments in this paper were carried out using an Omicron Nanotechnology LT STM/DFM in the qPlus configuration and carried out in a low temperature cryostat cooled to approximately 78 K using liquid nitrogen, in ultrahigh vacuum (UHV)
Summary
Since atomic resolution was first obtained by scanning probe microscopy (SPM),[1] scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) have become invaluable tools for both surface science and nanoscience. In recent years a focus has developed on determining the structure of the very apex of the tip by combining experiment with detailed theoretical calculations[2,3,4] or by inverse imaging of the tip on a known surface moiety.[5,6,7] A parallel stream of work, pioneered by the group at IBM Zurich, involves the functionalisation of a metal tip with a known molecule or atom in order to provide a well defined termination This has been key to both obtaining, and interpreting, striking sub-molecular resolution on planar organic molecules in dynamic force microscopy (DFM) - known as non-contact atomic force microscopy (NC-AFM).[8]. It was shown that these features could be reproduced with the lobes aligned in directions not perpendicular to the scan direction,[11] and theoretical calculations suggested that the double lobe features might be observable.[12]
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