Abstract
The objective of this paper is to discuss the issue of the projection uniformity of asymmetric fractional factorials. On the basis of Lee discrepancy, the authors define the projection Lee discrepancy to measure the uniformity for low-dimensional projection designs. Moreover, the concepts of uniformity pattern and minimum projection uniformity criterion are proposed, which can be used to assess and compare two and three mixed levels factorials. Statistical justification of uniformity pattern is also investigated.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
