Abstract
A new method for modelling, concurrently, the small-signal and the noise performance of active microwave devices is proposed. Here the determination of the element values in a device equivalent circuit is no longer dependent only on the scattering parameters, but also on the device noise parameters. In other words, the device noise performance is treated as an intrinsic set of characteristics of a device like the S-parameters themselves and influences the determination of element values in the device equivalent circuit. On using the concurrent modelling procedure suggested in this paper, it has been found that, not only can the small-signal performance be simulated accurately, but also the prediction of noise performance is in much better agreement with measurements than those of recent published models [1, 2]
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