Abstract
In order to explain the effect of uniaxial strain on the critical current of DI-BSCCO-Bi2223 tapes, we employed a springboard sample holder that can smoothly and continuously apply both tensile and compressive strains to tape samples. Over a narrow tensile strain region, the critical current in the tapes decreased linearly with increasing strain and returned reversibly with decreasing strain. When compressive strain was applied, the critical current first increased and then reached a weak maximum. Thereafter, it decreased monotonically with further increases in compressive strain. At room temperature, the local strain exerted on BSCCO filaments was measured by means of a quantum beam diffraction technique. Over the whole tensile strain region up to 0.2% and the small compressive strain range, the local strain changed linearly with applied strain. When the compressive strain was applied beyond the relaxation strain, the local strain (measured by diffraction) versus the applied strain (measured using a strain gauge) deviated from linearity, which is characteristic of strain relaxation and the onset of BSCCO filament fracture. Thus, the strain at the maximum critical current corresponds to a crossover point in strain, above which the critical current decreased linearly and reversibly with increasing applied strain, and below which the critical current decreased due to the BSCCO filament fracture. In this paper, we clearly characterize the reversible range terminated by both compressive and tensile strains, in which filaments do not fracture. Our analysis of the compressive regime beyond the relaxation strain suggests that although BSCCO filament fracture is the primary factor that leads to a decrease in critical current, the critical current in those regions of filaments that are not fractured increases linearly and reversibly with decreasing applied strain at compressive strains well beyond the reversible region for the tape.
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