Abstract
We examine the stability of lamellar stacks in the presence of an electric field, , applied normal to the lamellae. Calculations are performed with self-consistent field theory (SCFT) supplemented by an exact treatment of the electrostatic energy for linear dielectric materials. The calculations identify a critical electric field, , beyond which the lamellar stack becomes unstable with respect to undulations. This rapidly decreases towards zero as the number of lamellae in the stack diverges. Our quantitative predictions for are consistent with previous experimental measurements by Xu and co-workers.
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