Abstract
A crucial parameter in understanding hot electron physics is the electron–phonon (EP) coupling factor along with the governing physical relationships of the Two-Temperature Model (TTM) for electron thermalization. One of the most common ways to experimentally interrogate EP coupling is via ultra-fast optical excitement and thermoreflectance measurement. While there has been a significant amount of work using this method, there has been relatively little exploration of the sensitivity of the TTM to the parameters involved. In this work, we utilize the mathematical formulation of the least squares fitting method in order to understand the sensitivity of the TTM to the various thermophysical factors involved. We find that analysis of the sum of squared errors yields substantial physical insight and will help guide experimentalists in their ability to confidently measure a wide variety of hot electron dynamics.
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