Understanding the Kinetics of Cation Insertion-Coupled Electron Transfer in Thin Film Electrodes from Cyclic Voltammetry

Abstract

Cyclic voltammetry is a powerful technique for probing the electrochemical kinetics of energy storage materials. However, interpretation of the cyclic voltammetry kinetics of such materials has been limited by the application of analytical solutions initially developed for ion blocking electrodes, whereby mass transport is limited to semi-infinite diffusion in the electrolyte medium. Here, we utilize established numerical simulation models for finite diffusion coupled with experimental results of a model insertion electrode to demonstrate the relationship between solid-state diffusion and cyclic voltammetry current, peak potential, and capacity. This simulation is publicly available.1 We show that the cyclic voltammetry response of thin film electrode materials undergoing solid-solution ion insertion without significant Ohmic polarization can be explained with finite diffusion. Specifically, we investigate the kinetic behavior of Li+ insertion-coupled electron transfer into thin films of orthorhombic Nb2O5. We observe a general trend in the b-value, a descriptive parameter derived from the relation ip=avb between peak current ip and scan rate v. We find that both in simulation and experiment, we can tune the b-value response between the theoretically limiting values of 0.5 and 1 based on the solid-state diffusion characteristics of the thin film and the experimental timescale. We also show that b-values below 0.5 are possible, and arise due to a combined effect of the potential window of the experiment and confined diffusion. Our findings show the power of a simple 1D finite-diffusion model for predicting the kinetic response of an electrode undergoing ion-coupled electron transfer, and help to inform on how the scan rate selection in voltammetry experiments affects the observed kinetic behavior. https://github.com/mchagnot/Numerical_CV_Sim_1D_Diffusion