Abstract
The diluted magnetic semiconductor (DMS) Si1-xNix with four different dopant concentrations x = 0, 0.03, 0.06, 0.09 and 0.12 has been processed using ball milling technique. Powder X – ray diffraction data sets were collected for the samples and the structural and charge density analysis were carried out using Rietveld technique and maximum entropy method (MEM) respectively. The local structure was analyzed using pair distribution function (PDF) analysis. Magnetic measurements taken using vibrating sample magnetometer (VSM) reveal the ferromagnetic nature of the prepared DMS samples. Experimental estimation of charge density using maximum entropy method (MEM) complements semiconductor to metal transition and p – n type transition of Si1-xNix system as a function of concentration of Ni impurity in the system. The utility of Si1-xNix as a DMS material is established from these studies.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
