Abstract
In solid-state physics research, the spacing and arrangement of atoms play a crucial role in determining the properties of solids. Therefore, it is essential to analyze the structural characteristics in order to understand new physical phenomena within solids. X-ray characterization is considered a highly important technique in the field of material characterization, as it provides information about atomic-scale features. In Korea Institute of Science and Technology (KIST), extensive researches are conducted on the structural characteristics of various materials and the corresponding physical phenomena. To efficiently operate, manage, and further develop advanced analytical methods, the centralized X-ray characterization instrument facility was established in the Analysis and Data Center at KIST in January 2013, named ‘X-ray Open Lab.’ In this special issue, we would like to introduce X-ray diffraction (XRD) technique and their principle, which is the most widely utilized analysis equipment among the analytical instruments available at the X-ray Open Lab.
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