Abstract
The surface stress associated with the underpotential deposition (upd) of thallium (Tl) on (111)-textured Au is examined, using the wafer curvature method in acidic perchlorate supporting electrolyte. The process is also examined by independent nanogravimetric measurements using an electrochemical quartz crystal nanobalance (EQCN). We observe a sweep rate dependence for both the individual voltammetric waves and stress response, which we attribute to kinetically controlled surface alloying that occurs only at low coverage. Similar behavior has been reported for Pb upd on (111)-textured Au, but the kinetics for Tl are considerably slower and are very sensitive to the defect density of the Au(111) surface. At high coverage, a full Tl monolayer is formed; however, a dealloying step is required prior to completion of the monolayer. The stress hump that is coincident with the last voltammetric wave appears to be caused by the formation and removal of the surface alloy. This is confirmed by long-term potentiostatic pulsing experiments.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.