Unconventional reliability growth models-comparison and evaluation

Abstract

The reliability of electronic circuits, systems and devices is one component of their quality. An electronic device has three phases of existence. First phase - the development is very important for reliability growth. In this phase constructor implements three basic components of reliability - reliability, longevity and maintainability in the electronic device. The reliability growth model (RGM) is a very specific tool used during the development phase of electronic devices and software products. New unconventional reliability growth models are based on the homogeneity testing of different Poisson process characteristics. This enables to find the time frame for finishing the technological constructing operations for further reliability growth in the next design of an electronic object. The goal is to find boundary time tb using statistical methods, from which the Poisson process is homogenous (stationary). We introduce experimental results those obtained by applying new unconventional reliability growth models. In the future it will be very interesting to develop algorithm testing the homogeneity of Poisson process of correlation function R (t1, t2), algorithm testing the homogeneity of Poisson process in his time-frequency representation. We review some new unconventional reliability growth models of electronic devices, compare and evaluate them in this paper.