Abstract
Phase flicker has become an important performance parameter for the liquid crystal on silicon (LCOS) devices. Since the phase response of the LCOS device cannot be measured directly, it is usually derived from the intensity response of the modulated light beam when the LCOS device was placed between a pair of crossed polarisers. However, the relationship between the intensity of the beam and the phase response of the LCOS device is periodic. This would lead to uncertainty in the phase flicker measurement. This paper analyses this measurement uncertainty through both simulation and experiments. It also proposed a strategy to minimise the uncertainty.
Highlights
As the phase of the light cannot be measured directly, the temporal phase response of the liquid crystal on silicon (LCOS) devices is derived from the temporal intensity of the modulated light beam in both setups
Our simulation and experimental results have demonstrated that the turning points of the intensity response will cause uncertainty in the phase flicker analysis
This paper demonstrated that there is a high degree of uncertainty in the phase This paper demonstrated that there is a high degree of uncertainty in the phase flicker flicker calculation in the presence of the noise from the characterisation system
Summary
Publisher’s Note: MDPI stays neutral with regard to jurisdictional claims in published maps and institutional affiliations. As the phase of the light cannot be measured directly, the temporal phase response of the LCOS devices is derived from the temporal intensity of the modulated light beam in both setups. The polarisation direction of the the LCOS of optical beam atwere the◦detector plane modulated by the phase depth of device was aligned 45 with respect to these polarisers. In this setup, the intensity of optical device. In order to characterise the phase flicker, a high-speed amplified photodiode cirbeam at the detector plane can be modulated by the phase depth of the LCOS device. The analysis will be based on the polarimetric of system
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