Uncertainty evaluation for raman shift measurement of fullerene by least square method [In Metrology Women Research

Abstract

As a new kind of emerging semiconducting materials, fullerene nanofiber has been widely used in applications such as solar cells, MEMS, composite fillers, superconductors, etc. Raman spectroscopy is a commonly used technique for fullerene characterization, as the variations in Raman shifts potentially reveal the sub-structure and internal motions of fullerene. However, the Raman shifts of fullerene are very sensitive to measurement conditions. For example, under relative high laser exposure energy, peak positions will shift to lower wave numbers due to induced polymerization. Therefore, pre-standardization is necessary for characterization of fullerene nanofibers by Raman spectroscopy.