Abstract
AbstractWe have examined the uncertainties involved in using the visual surface brightness technique on Galactic Cepheid variables. The random error in a single Cepheid distance measurement is well determined to be ±8%. An upper limit to the systematic uncertainty is shown to be ±6% in distance. These combine for a single Cepheid to a typical uncertainty of ±10% and, for samples larger than ten Cepheids, to a typical uncertainty of less than ±6% in distance.
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