Abstract
Abstract Computer techniques are discussed for the characterization of typical Schottky barrier diodes in a convenient manner for the rapid evaluation of out-of-balance effects such as carrier or. local oscillator leak in conventional two-diode mixer and modulator circuits. The usefulness of the technique in assessing temperature effects on the circuit performance and the influences of individual diode parameters are demonstrated and good agreement achieved between measured and predicted performance for a typical circuit.
Published Version
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