Abstract
A theoretical approach is developed to invert analytically a hard X-ray analyser-based phase-contrast image of a known weak object to recover the complex amplitude reflection coefficient (ARC) of a laterally homogeneous crystal. Numerical simulations test the method to recover the ARC from two systems of interest: a thick perfect crystal and a linearly strained thin film. For the latter model, a kinematical diffraction approximation was used to recover the one-dimensional deformation profile from the ARC.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
