Abstract

Ferromagnetic MnAl (L10-MnAl phase) ultrathin films with thickness varying from 1 to 5 nm have been epitaxially grown on a GaAs (001) substrate. A coercivity above 8 kOe has been obtained with no need of a buffer layer by tuning the sample preparation and the growth parameters. Surface and interface analysis carried out by in situ characterization techniques (x-ray photoelectron spectroscopy and low energy electron diffraction), available in the molecular beam epitaxy chamber, has shown the formation of a ferromagnetic interface consisting of Mn-Ga-As-Al, which contribution competes with the MnAl alloyed film. The appearance of this interface provides important information to understand the growth mechanism of MnAl-based films reported in the literature.

Highlights

  • Ultrathin films of L10-MnAl on GaAs (001): A hard magnetic MnAl layer onto a soft MnGa-As-Al interface

  • Thin films with perpendicular magnetic anisotropy are attracting a lot of interest in spintronic devices, in particular in STT-MRAM (Spin-Transfer-Torque Magnetic Random Access Memory) and p-MTJs.[1,2]

  • The L10MnAl is a rare-earth free material that it has been proposed for certain applications as rare earth free permanent magnets,[6,9,10,11,12,13,14] due to their well known high magnetic anisotropy constants.[1,15]

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Summary

Introduction

Ultrathin films of L10-MnAl on GaAs (001): A hard magnetic MnAl layer onto a soft MnGa-As-Al interface.

Results
Conclusion
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